DocumentCode :
3481156
Title :
Investigation of Ne IX and Ne X line emission from a gas-puff Z-pinch plasma using Ross filter systems
Author :
Bogatu, I.N. ; Gregorian, L. ; Klodzh, E. ; Kroupp, E. ; Maron, Y. ; Ralchenko, Yu.V.
Author_Institution :
Weizmann Inst. of Sci., Rehovot, Israel
Volume :
2
fYear :
1998
fDate :
1998
Firstpage :
577
Abstract :
Semiconductor detectors can provide measurements of the X-ray emission spectra from Z-pinch plasmas with spectral, time and spatial resolution simultaneously. PIN detectors working in the current regime (up to 1 A), fast enough (1 nsec rise time), and small enough (1 to 3 mm 2 active area) are suitable, provided the X-ray spectral resolution is achieved by some element external to the detector before the X-ray flux is reaching its sensitive area. Ross (or balanced) filters are especially useful for this X-ray filtration system. A Ross filter system was designed and built for the investigation of the Ne IX and Ne X line emission. The experiments were carried out on the moderate density and temperature Ne plasma (14 mm length and approximately <1 mm final diameter) produced in a 1.2 μs, 300 kA gas-puff Z-pinch device. The current is measured by an absolutely calibrated one turn B-dot coil located at 8 cm distance from the z-axis. We are reporting the first results of the Ne IX and Ne X ion line emission measurements using the recently built Ross filter diagnostic
Keywords :
X-ray detection; X-ray emission spectra; Z pinch; neon; plasma diagnostics; positive ions; semiconductor counters; 1 A; 1 mm; 1 ns; 1.2 mus; 14 mm; 300 kA; 8 cm; Ne; Ne IX; Ne X; Ne X line emission; Ne plasma; PIN detectors; Ross filter systems; X-ray flux; X-ray spectral resolution; gas-puff Z-pinch plasma; line emission measurements; Filters; Filtration; Plasma measurements; Plasma temperature; Plasma x-ray sources; Spatial resolution; Temperature sensors; Time measurement; X-ray detection; X-ray detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Power Particle Beams, 1998. BEAMS '98. Proceedings of the 12th International Conference on
Conference_Location :
Haifa
Print_ISBN :
0-7803-4287-9
Type :
conf
DOI :
10.1109/BEAMS.1998.816920
Filename :
816920
Link To Document :
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