• DocumentCode
    3481307
  • Title

    Accelerated aging test and failure analysis of high brightness light emitting diodes

  • Author

    Fei Yuan ; Kailin Pan ; Shujing Chen ; Yu Guo ; Na Wei

  • Author_Institution
    Sch. of Mech. & Electr. Eng., Guilin Univ. of Electron. Technol., Guilin, China
  • fYear
    2013
  • fDate
    11-14 Aug. 2013
  • Firstpage
    1040
  • Lastpage
    1043
  • Abstract
    The degradation of high power white and blue light-emitting diodes (LEDs) was investigated by considering the electrical, optical and phosphor conversion. The LED samples were tested at the elevated temperature of 40°C with 700mA, 900mA, 1200mA. In order to research the degradation rule of fluorescent power in white LED, aging studies using white and blue LEDs with same batch of chips under same invariableness current and same conditions were performed. It has indicated that from blue light to yellow light the transition rate reduced by following the rule of exponential function. And it reduced faster when the electrical current was higher. The yellowing of the optical lens and structural degradations, such as phosphor carbonization in high temperature, causes the light output attenuation. Meanwhile, the relationship and interplay of electrical, optical and phosphor characteristics were found in experiments.
  • Keywords
    ageing; failure analysis; lenses; light emitting diodes; phosphors; reliability; LED; accelerated aging test; blue light-emitting diodes; current 1200 mA; current 700 mA; current 900 mA; failure analysis; high-brightness light emitting diodes; light output attenuation; optical lens; phosphor carbonization; structural degradations; temperature 40 degC; white light-emitting diodes; Accelerated aging; Degradation; Light emitting diodes; Optical attenuators; Phosphors; Stimulated emission; electrical current; optical; phosphor characteristics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
  • Conference_Location
    Dalian
  • Type

    conf

  • DOI
    10.1109/ICEPT.2013.6756637
  • Filename
    6756637