Digital Signal Processing Based Waveform Generator for Flickermeter Calibration Test System

This paper describes a method of waveform generation using digital signal processing processor for flickermeter calibration test system. Flickermeter is a power analyzer designed to quantify to what degree the light intensity variation caused by voltage changes will irritate test subjects. Calibration test system for flickermeters is a system used to generate and measure accurately all the modulated test signals required for testing flickermeters [1]. Two waveform generators are needed in the system to produce the test conditions; one represents the mains frequency, generating frequency of 50 Hz while another represents the modulating frequency, generating frequencies from 2-25 Hz. The modulating frequencies, acting as flicker, are to be applied with the main frequency, resulting in modulation of frequencies. The DSP processor TMS320C6713DSK with code composer studio has been used to generate the two waveforms. It generates waveforms with different frequencies by using the look-up tables for the required waveforms up to 32 kHz. The required waveform, amplitude, and frequency can be programmed by the user. The DSP processor has also been programmed to produce amplitude modulated signal. Using the stereo audio codec of the kit, two difference types of frequencies have been generated simultaneously.