• DocumentCode
    3481473
  • Title

    Reliability analysis of premature failed 11/0.433kV hermetically sealed distribution transformers

  • Author

    Ridwan, Mohd Iqbal ; Samsudin, Mohd Raffi ; Ghazali, Young Zaidey Yang

  • Author_Institution
    TNB Res. Sdn Bhd, Malaysia
  • fYear
    2011
  • fDate
    5-6 Dec. 2011
  • Firstpage
    321
  • Lastpage
    326
  • Abstract
    There were around 450 units of 11/0.433kV distribution transformers which have found to fail prematurely over the past 15 years. These distribution transformers are vital to power utilities as they supply electricity to respective customers in industrial, commercial or domestic areas. Failure of distribution transformers will result in power interruption which not only reduces the utility´s revenue, but also causes loss of customer confidence towards the utility. Hence, it is imperative that power utilities, such as Tenaga Nasional Berhad (TNB) to perform studies to assess the reliability of distribution transformer. The reliability analysis is supported by the internal inspection which was guided by a standardized procedure. This paper presents a reliability analysis method called Life Data Analysis which utilizes statistical distribution, Weibull distribution to analyze and compare the reliability of distribution transformers from 3 different manufacturers. It has been found that the findings of the reliability parameters are consistent with the nature of incipient faults in the transformer.
  • Keywords
    Weibull distribution; hermetic seals; power transformers; reliability; Weibull distribution; hermetically sealed distribution transformers; internal inspection; life data analysis; power interruption; reliability analysis; statistical distribution; voltage 0.433 kV; voltage 11 kV; Data models; Gaskets; Labeling; Oil insulation; Reliability; Shape; Silicon; Failure Mode; Failure Rate; Life Data Analysis; Reliability; Weibull Distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Humanities, Science and Engineering (CHUSER), 2011 IEEE Colloquium on
  • Conference_Location
    Penang
  • Print_ISBN
    978-1-4673-0021-6
  • Type

    conf

  • DOI
    10.1109/CHUSER.2011.6163742
  • Filename
    6163742