Title : 
60 GHz bandpass filters with small and large bandwidths using thin film coupled microstrip in 0.18-μm CMOS
         
        
            Author : 
Nan, Lan ; Mouthaan, Koen ; Xiong, Yong-Zhong ; Shi, Jinglin ; Rustagi, Subhash Chander ; Brinkhoff, James ; Ooi, Ban-Leong
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
         
        
        
        
        
        
            Abstract : 
In recent publications of millimeter wave filters in standard CMOS, only single designs have been shown, all with bandwidths exceeding 25%. Here we present the systematic design and implementation of 60 GHz bandpass filters with a broad range of bandwidths in a 0.18-mum CMOS technology. Experimental results show that filters with bandwidths larger than 50% achieve an insertion loss less than 3 dB. The insertion loss increases to 9 dB as the bandwidth decreases to 10%. Furthermore, the relationship between insertion loss and bandwidth is established through measurement and compared to theoretical predictions. The results facilitate important design trade-offs for bandpass filter in transceiver front-end applications.
         
        
            Keywords : 
CMOS integrated circuits; band-pass filters; microstrip circuits; millimetre wave filters; thin film circuits; bandpass filters; bandwidth 60 GHz; loss 9 dB; millimeter wave filters; standard CMOS; systematic design; thin film coupled microstrip; transceiver front-end applications; Band pass filters; Bandwidth; CMOS technology; Insertion loss; Loss measurement; Microstrip filters; Millimeter wave technology; Standards publication; Transceivers; Transistors;
         
        
        
        
            Conference_Titel : 
Microwave Conference, 2008. APMC 2008. Asia-Pacific
         
        
            Conference_Location : 
Macau
         
        
            Print_ISBN : 
978-1-4244-2641-6
         
        
            Electronic_ISBN : 
978-1-4244-2642-3
         
        
        
            DOI : 
10.1109/APMC.2008.4958053