Title :
Self-Checking Carry Select Adder with Fault Localization
Author :
Akbar, M. Amirullah ; Jeong-A Lee
Author_Institution :
Dept. of Comput. Eng., Chosun Univ., Gwangju, South Korea
Abstract :
The common design problem in various approaches for self-checking adders is the fault propagation due to carry. Such a fault can misguide the system to detect the particular faulty module. In this paper, we proposed a self-checking Carry Select Adder (CSA) with fault localization ability. Our scheme can provide minimum area overhead for self-recovery process because instead of replacing the whole system we can now replace the particular faulty modules. The proposed self-checking CSA consumes 12% less area with equal performance as compared to the previously proposed self-checking CSA approach.
Keywords :
adders; carry logic; fault location; fault tolerant computing; logic design; carry select adder; fault localization; fault propagation; self-checking CSA; self-recovery process; Adders; Circuit faults; Hardware; Logic gates; Redundancy; Transistors; Tunneling magnetoresistance; carry-select adder; fault localization; self-checking adder;
Conference_Titel :
Digital System Design (DSD), 2013 Euromicro Conference on
Conference_Location :
Los Alamitos, CA
DOI :
10.1109/DSD.2013.96