• DocumentCode
    3481549
  • Title

    Self-Checking Carry Select Adder with Fault Localization

  • Author

    Akbar, M. Amirullah ; Jeong-A Lee

  • Author_Institution
    Dept. of Comput. Eng., Chosun Univ., Gwangju, South Korea
  • fYear
    2013
  • fDate
    4-6 Sept. 2013
  • Firstpage
    863
  • Lastpage
    869
  • Abstract
    The common design problem in various approaches for self-checking adders is the fault propagation due to carry. Such a fault can misguide the system to detect the particular faulty module. In this paper, we proposed a self-checking Carry Select Adder (CSA) with fault localization ability. Our scheme can provide minimum area overhead for self-recovery process because instead of replacing the whole system we can now replace the particular faulty modules. The proposed self-checking CSA consumes 12% less area with equal performance as compared to the previously proposed self-checking CSA approach.
  • Keywords
    adders; carry logic; fault location; fault tolerant computing; logic design; carry select adder; fault localization; fault propagation; self-checking CSA; self-recovery process; Adders; Circuit faults; Hardware; Logic gates; Redundancy; Transistors; Tunneling magnetoresistance; carry-select adder; fault localization; self-checking adder;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design (DSD), 2013 Euromicro Conference on
  • Conference_Location
    Los Alamitos, CA
  • Type

    conf

  • DOI
    10.1109/DSD.2013.96
  • Filename
    6628370