Title :
Reliability of semiconductor lasers optical fiber transmission systems
Author_Institution :
NTT Opto-Electron. Labs., Kanagawa, Japan
fDate :
31 Oct-3 Nov 1994
Abstract :
Semiconductor lasers have recently been applied to various kinds of optical fiber transmission systems as transmitter sources or pumping sources for optical fiber amplifiers. These lasers have a wide range of characteristics and structures corresponding to the application fields. The most degradation mechanisms, however, originate from their surfaces or interfaces. In this paper, the reliabilities of 0.98 μm pumping sources, 1.3 and 1.55 μm strained MQW InGaAsP/lnP lasers buried by semi-insulating iron-doped InP, and 1.55 μm (strained) InGaAsP/lnP MQW DFB lasers for d-WDM are discussed from the viewpoint of the surface-or interface-related problems
Keywords :
semiconductor lasers; 0.98 mum; 1.3 mum; 1.55 mum; InGaAsP-InP; InGaAsP/lnP lasers; MQW DFB lasers; degradation mechanisms; interfaces; optical fiber amplifiers; optical fiber transmission systems; pumping sources; reliability; semiconductor lasers; strained MQW lasers; surfaces; transmitter sources; wavelength division multiplexing; Degradation; Fiber lasers; Laser excitation; Optical fiber amplifiers; Optical fibers; Optical transmitters; Pump lasers; Quantum well devices; Semiconductor device reliability; Semiconductor lasers;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1470-0
DOI :
10.1109/LEOS.1994.586309
