DocumentCode :
3481865
Title :
Voltage Stability Margin Enhancement Using Evolutionary Programming (EP)
Author :
Hassim, F.I.H. ; Musirin, Ismail ; Rahman, Titik Khawa Abdul
Author_Institution :
Maxis Commun., Univ. Teknol. MARA, Shah Alam
fYear :
2006
fDate :
27-28 June 2006
Firstpage :
235
Lastpage :
240
Abstract :
System violation in a power system resulted from the spectacular voltage drop caused by the overloading condition has become a serious problem these days. This incident has occurred in the presence of voltage instability which has partly contributed to the monetary losses resulted from the failure transmission process. Limited operating margin in power operating system has also caused such system experienced lack of reactive power support. Therefore, voltage stability margin enhancement could be planned in order to alleviate the voltage instability occurrence which could lead to cascaded blackout in a system. This paper presents voltage stability margin (VSM) enhancement using optimal reactive power support, achieved using evolutionary programming (EP) technique. The implementation of optimal reactive power dispatch as the reactive support technique has resulted promising results in terms of broadening the VSM, along with voltage stability and voltage profile improvement with transmission losses minimized. Realization of the proposed technique on an IEEE model validated the effectiveness of the technique which can be highlighted as its merit.
Keywords :
evolutionary computation; power system stability; reactive power; IEEE model; cascaded blackout; evolutionary programming; optimal reactive power dispatch; overloading condition; power system; reactive power support; transmission losses; voltage drop; voltage instability; voltage stability margin enhancement; Circuit stability; Genetic programming; IEEE members; Load flow; Power system stability; Power systems; Reactive power; Stability analysis; Steady-state; Voltage; Evolutionary programming; fitness; maximum loadability; objective function; optimization; voltage profile; voltage stability margin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Research and Development, 2006. SCOReD 2006. 4th Student Conference on
Conference_Location :
Selangor
Print_ISBN :
978-1-4244-0526-8
Electronic_ISBN :
978-1-4244-0527-5
Type :
conf
DOI :
10.1109/SCORED.2006.4339345
Filename :
4339345
Link To Document :
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