• DocumentCode
    348191
  • Title

    Capabilities and limitations of semiconductor surge voltage suppressors

  • Author

    Obreja, Vasile V N

  • Author_Institution
    Nat. R&D Inst. for Microtechnol., Bucharest, Romania
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    169
  • Abstract
    A short presentation and comparison of characteristics of the commercial available semiconductor transient voltage suppressors is carried out. Illustrative device electrical characteristics are shown, revealing that the silicon junction breakdown suppressors may have a superior overall technical performance, when are compared with silicon thyristor suppressors and metal-oxide varistors
  • Keywords
    avalanche diodes; elemental semiconductors; power semiconductor devices; power system transient stability; semiconductor junctions; silicon; surge protection; Si; Si junction breakdown suppressors; capabilities; device electrical characteristics; limitations; metal-oxide varistors; semiconductor surge voltage suppressors; semiconductor transient voltage suppressors; thyristor suppressors; Breakdown voltage; Electric breakdown; Electric variables; Phase change random access memory; Research and development; Silicon devices; Solid state circuits; Surges; Thyristors; Varistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 1999. CAS '99 Proceedings. 1999 International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-5139-8
  • Type

    conf

  • DOI
    10.1109/SMICND.1999.810455
  • Filename
    810455