Title :
Automatic Testing In Tbe Airline Industry
Author_Institution :
Pan Am
Keywords :
Aerospace electronics; Aerospace industry; Aircraft; Automatic testing; Continents; Control systems; Electronic components; Electronics industry; Performance evaluation; Standards development;
Conference_Titel :
Electro International, 1991
Conference_Location :
New York, NY, USA
DOI :
10.1109/ELECTR.1991.718252