DocumentCode
3482014
Title
A multivariate system reliability estimation method based on step stress accelerated degradation testing
Author
Hongliang Jia ; Miao Cai ; Daoguo Yang
Author_Institution
Sch. of Mech. & Electr. Eng., Guilin Univ. of Electron. Technol., Guilin, China
fYear
2013
fDate
11-14 Aug. 2013
Firstpage
1166
Lastpage
1169
Abstract
In this paper, a multivariate system reliability estimation method based on step stress accelerated degradation testing is proposed. Firstly, the method of step stress accelerated degradation testing (SSADT) is utilized to evaluate the reliability of LED luminaries. In the test, temperature is determined as the sensitive stress. Secondly, we suppose that all the performance metrics follow normal distribution and the variation of distribution parameters with time is employed to indicate the performance degradation. Arrhenius model is used to do the extrapolation. Thirdly, the correlation coefficients between different performance metrics are described as a Dunnett-Sobel class correlation matrix to consider the statistical dependence. At the same time, the dependent performance metrics are transformed to conditional-independent random variables. Then, the failure criteria are determined according to the standard from Energy Star. Subsequently, the system reliability is calculated based on total probability theorem and Monte Carlo simulation. At last, the system reliability of the LED luminaries considering lumen maintenance, CCT and color maintenance simultaneously is obtained.
Keywords
Monte Carlo methods; light emitting diodes; matrix algebra; normal distribution; probability; reliability; Arrhenius model; Dunnett-Sobel class correlation matrix; Energy Star standard; LED luminaries reliability; Monte Carlo simulation; SSADT; conditional-independent random variables; correlation coefficients; dependent performance metrics; distribution parameters variation; extrapolation; failure criteria; multivariate system reliability estimation method; normal distribution; performance degradation; sensitive stress; statistical dependence; step stress accelerated degradation testing; total probability theorem; Degradation; Estimation; Light emitting diodes; Maintenance engineering; Measurement; Reliability; Stress; Dunnett-Sobel; LED luminaries; SSADT; multivarite system reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2013 14th International Conference on
Conference_Location
Dalian
Type
conf
DOI
10.1109/ICEPT.2013.6756666
Filename
6756666
Link To Document