• DocumentCode
    3482156
  • Title

    Artificial surface with asymmetric reflection properties

  • Author

    Chang, Kihun ; Ahn, Jihwan ; Yoon, Young Joong

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Yonsei Univ., Seoul
  • fYear
    2008
  • fDate
    16-20 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    An artificial surface with asymmetric reflection properties is presented. By covering a metal ground plane with periodic metal-dielectric composite textures, the electromagnetic reflection properties can be altered. By tuning the individual lattice of a periodic mushroom-type texture to vary the surface impedance, a surface with graded reflection phases as a function of position can be designed. Applying a linear gradient in the reflection coefficient phase along the face, the proposed surface is electromagnetically inclined, even though physically flat. For the whole ranges of the incident angle, this metasurface reveals asymmetric reflection properties contrary to the law of reflection. The reflection patterns from the surface, the boundary condition, and the relation between the incident angle and the reflection angle are presented.
  • Keywords
    conductors (electric); electromagnetic wave reflection; photonic band gap; artificial surface; asymmetric reflection properties; electromagnetic bandgap structure; electromagnetic reflection properties; graded reflection phase; incident angle; law of reflection; metal ground plane; metal-dielectric composite textures; mushroom-type texture; reflection angle; reflection coefficient phase; surface impedance; Boundary conditions; Electromagnetic reflection; Lattices; Metamaterials; Periodic structures; Resonance; Resonant frequency; Surface impedance; Surface texture; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2008. APMC 2008. Asia-Pacific
  • Conference_Location
    Macau
  • Print_ISBN
    978-1-4244-2641-6
  • Electronic_ISBN
    978-1-4244-2642-3
  • Type

    conf

  • DOI
    10.1109/APMC.2008.4958081
  • Filename
    4958081