DocumentCode :
3482778
Title :
Optical methods for extreme level measurement
Author :
Drexler, P. ; Jirku, T. ; Steinbauer, M. ; Fiala, P.
Author_Institution :
Brno Univ. of Technol., Brno
fYear :
2007
fDate :
4-8 June 2007
Firstpage :
131
Lastpage :
135
Abstract :
There are certain optical methods for the measurement of ultra-short solitary electromagnetic pulses or low-level measurement. The measurement methods properties have to correspond to the fact of whether we want to measure pulses of voltage, current or a free-space electromagnetic wave. The need for specific measurement methods occurred owing to the development of high power microwave pulse generator. Certain applicable methods are presented in this paper. For the same purpose, the magneto-optic method can be utilized with respect to its advantages. For the measurement of the output microwave pulse of the generator, the optical method was designed and realized. Low-level optical measurement methods were used for nano-layers measurement and experimentally verified with regard to air ion concentration test.
Keywords :
electromagnetic pulse; microwave devices; pulse generators; pulse measurement; extreme level measurement; free-space electromagnetic wave; high power microwave pulse generator; optical methods; ultra-short solitary electromagnetic pulses; Current measurement; EMP radiation effects; Electromagnetic measurements; Level measurement; Microwave measurements; Microwave theory and techniques; Optical pulse generation; Optical pulses; Pulse measurements; Ultraviolet sources;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Waveform Diversity and Design Conference, 2007. International
Conference_Location :
Pisa
Print_ISBN :
978-1-4244-1276-1
Electronic_ISBN :
978-1-4244-1276-1
Type :
conf
DOI :
10.1109/WDDC.2007.4339395
Filename :
4339395
Link To Document :
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