DocumentCode
348289
Title
Low jitter dual semiconductor laser system using electrical phase shift for fast temporal scanning in time-resolved pump and probe experiments
Author
Reimann, O. ; Huhse, D. ; Bottcher, E.H. ; Bimberg, D. ; Stahlmann, H.D.
Author_Institution
Inst. of Solid State Phys., Tech. Univ. Berlin, Germany
Volume
2
fYear
1999
fDate
Aug. 30 1999-Sept. 3 1999
Firstpage
203
Abstract
Numerous important ultrafast measurement techniques such as electro-optical and photoconductive sampling are based on a pump and probe arrangement which requires a precisely adjustable time delay for short optical pulses. In order to overcome the relatively slow scanning speed of mechanical delay units alternative approaches using dual laser systems with rapid scanning capability have been investigated. Here, we report on a scanning dual laser system (SDLS) providing optical pulses for time-resolved pump and probe experiments with a freely adjustable temporal scanning range and high scanning speed. Compared to previously published results of 5.4-ps rms timing jitter between two fiber-lasers the described system has a pulse jitter of <1.5-ps rms without further electronic stabilization.
Keywords
high-speed optical techniques; measurement by laser beam; semiconductor lasers; timing jitter; electrical phase shift; jitter; optical pulse; scanning dual laser system; semiconductor laser; time delay; time-resolved pump-and-probe technique; ultrafast measurement; Delay effects; Jitter; Lasers and electrooptics; Measurement techniques; Optical pulses; Photoconductivity; Probes; Pump lasers; Sampling methods; Semiconductor lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 1999. CLEO/Pacific Rim '99. The Pacific Rim Conference on
Conference_Location
Seoul, South Korea
Print_ISBN
0-7803-5661-6
Type
conf
DOI
10.1109/CLEOPR.1999.811374
Filename
811374
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