DocumentCode :
348289
Title :
Low jitter dual semiconductor laser system using electrical phase shift for fast temporal scanning in time-resolved pump and probe experiments
Author :
Reimann, O. ; Huhse, D. ; Bottcher, E.H. ; Bimberg, D. ; Stahlmann, H.D.
Author_Institution :
Inst. of Solid State Phys., Tech. Univ. Berlin, Germany
Volume :
2
fYear :
1999
fDate :
Aug. 30 1999-Sept. 3 1999
Firstpage :
203
Abstract :
Numerous important ultrafast measurement techniques such as electro-optical and photoconductive sampling are based on a pump and probe arrangement which requires a precisely adjustable time delay for short optical pulses. In order to overcome the relatively slow scanning speed of mechanical delay units alternative approaches using dual laser systems with rapid scanning capability have been investigated. Here, we report on a scanning dual laser system (SDLS) providing optical pulses for time-resolved pump and probe experiments with a freely adjustable temporal scanning range and high scanning speed. Compared to previously published results of 5.4-ps rms timing jitter between two fiber-lasers the described system has a pulse jitter of <1.5-ps rms without further electronic stabilization.
Keywords :
high-speed optical techniques; measurement by laser beam; semiconductor lasers; timing jitter; electrical phase shift; jitter; optical pulse; scanning dual laser system; semiconductor laser; time delay; time-resolved pump-and-probe technique; ultrafast measurement; Delay effects; Jitter; Lasers and electrooptics; Measurement techniques; Optical pulses; Photoconductivity; Probes; Pump lasers; Sampling methods; Semiconductor lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO/Pacific Rim '99. The Pacific Rim Conference on
Conference_Location :
Seoul, South Korea
Print_ISBN :
0-7803-5661-6
Type :
conf
DOI :
10.1109/CLEOPR.1999.811374
Filename :
811374
Link To Document :
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