• DocumentCode
    3483413
  • Title

    Time resolved studies of electronic transport in polymeric insulators

  • Author

    Abkowitz, M.

  • Author_Institution
    Xerox Corp., Webster, NY, USA
  • fYear
    1989
  • fDate
    3-6 Jul 1989
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Transport in a wide variety of glassy polymeric insulators has been found to be characterized by a convoluted yet familiar pattern of electric field and temperature dependence below Tg, the glass transition temperature, and by a relatively abrupt change in temperature dependence near Tg. Though diverse, all of these glassy dielectrics share the feature that electronic transport is mediated by field-assisted thermally stimulated emission from localized states, a process which remains incompletely understood. By proper `molecular engineering´ it has become possible to design dielectric polymers which exhibit efficient and completely trap-free transport, a requisite feature for practical applications to electrophotography. The importance of the mechanistic understanding derived from analysis of time-resolved injection in the historical development of viable organic-polymer-based photoconductors is discussed. Three materials systems are described: (1) poly(N-vinylcarbazole), PVK; (2) molecularly doped polymers; and (3) polysilanes and polygermanes
  • Keywords
    carrier mobility; organic insulating materials; photoconducting materials; photoconductivity; polymers; Arrhenius plot; PVK; dielectric polymers; electronic transport; electrophotography; field-assisted thermally stimulated emission; glass transition temperature; glassy polymeric insulators; hole drift mobility; localized states; molecular engineering; molecularly doped polymers; photoconductors; poly(N-vinylcarbazole); polygermanes; polysilanes; temperature dependence; time-resolved injection; Design engineering; Dielectrics and electrical insulation; Electron traps; Electrophotography; Glass; Photoconductivity; Plastic insulation; Polymers; Stimulated emission; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, 1989., Proceedings of the 3rd International Conference on
  • Conference_Location
    Trondheim
  • Type

    conf

  • DOI
    10.1109/ICSD.1989.69151
  • Filename
    69151