• DocumentCode
    3483523
  • Title

    Feasibility of a fully integrated HEMT based charge amplifier: design and experiment

  • Author

    Arnaboldi, C. ; Cetronio, A. ; Guazzoni, C. ; Longoni, A. ; Pessina, G.

  • Author_Institution
    Dipartimento di Elettronica, Politecnico di Milano, Italy
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    19968
  • Abstract
    We have designed and tested a fully integrated HEMT based charge amplifier suitable for applications in high energy physics experiments and compatible to be directly integrated on the detector chip for compact, high performance Xand γ-ray imagers for medical diagnostics. The width of the input HEMT has been optimised with the constraint of a fixed low power dissipation. The DC and noise characteristics of different sample transistors have been measured in order to determine the relevant parameters for the proper design and simulation of the whole charge amplifier. A SPICE model was ad-hoc developed to simulate the behaviour of the HEMT in the biasing conditions of the designed amplifier. The circuit performances have been characterised in terms of output response, linearity and noise. For a detector capacitance of 5 pF and a feedback capacitance of 1 pF the measured rise time is 1.89 ns, while the measured ENC is 627 electrons r.m.s. at 20 ns shaping time. For this condition the dissipated power is 7 mW
  • Keywords
    amplifiers; high electron mobility transistors; nuclear electronics; semiconductor device models; semiconductor device noise; 1 pF; 5 pF; 7 mW; DC; SPICE; charge amplifier; detector capacitance; feedback capacitance; fully integrated HEMT based charge amplifier; linearity; noise; output response; transistors; Capacitance measurement; Circuit simulation; Constraint optimization; Gamma ray detection; Gamma ray detectors; HEMTs; Medical diagnosis; Medical tests; Power dissipation; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2000 IEEE
  • Conference_Location
    Lyon
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-6503-8
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2000.949870
  • Filename
    949870