DocumentCode :
348365
Title :
Optical characterization of surface oxide in Ge-Sb-Te alloy films
Author :
Sang Youl Kim ; Sang June Kim ; Tae Hee Jeong ; Jeong Woo Park ; Cheong Yeon ; Hun Seo
Author_Institution :
Dept. of Phys., Ajou Univ., Suwon, South Korea
Volume :
2
fYear :
1999
fDate :
Aug. 30 1999-Sept. 3 1999
Firstpage :
379
Abstract :
Ge-Sb-Te alloy film phase change recording layer can deteriorate the cyclability and it can be reduced with the nitrogen treatment. It is reported that the jitter characteristics over read-write cycle has been greatly improved. In the present research, the evolution of the surface oxide in Ge-Sb-Te alloys including nitrogen doped ones is investigated. The variation of the observed reflectivity spectra is compared with the calculated one.
Keywords :
antimony alloys; germanium alloys; optical films; optical storage; solid-state phase transformations; Ge-Sb-Te alloy films; Ge-Sb-Te:N alloy film phase change recording layer; GeSbTe:N; cyclability; jitter characteristics; nitrogen treatment; optical characterization; optical storage; read-write cycle; reflectivity spectra; surface oxide; Amorphous materials; Crystallization; Nitrogen; Optical films; Optical recording; Optical refraction; Optical variables control; Reflectivity; Refractive index; Surface contamination;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO/Pacific Rim '99. The Pacific Rim Conference on
Conference_Location :
Seoul, South Korea
Print_ISBN :
0-7803-5661-6
Type :
conf
DOI :
10.1109/CLEOPR.1999.811479
Filename :
811479
Link To Document :
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