DocumentCode
3483748
Title
Experimental design for equipment qualification and matching
Author
Tripsas, Nick ; Johnson, Ronald
Author_Institution
Adv. Micro Devices Inc., Sunnyvale, CA, USA
fYear
1996
fDate
16-21 Jun 1996
Firstpage
509
Lastpage
511
Abstract
Process qualifications are required as new equipment is added to a fab to ensure good product quality. For Ion Implanters, dose-matching of machines is a necessary first step in this procedure. Split-lot qualifications are also commonly run prior to releasing a new machine to production. The design of these experiments is crucial to efficient qualification. The use of a fractional factorial design ensures that a lot is split differently at each implant layer. Statistical analysis can independently check each implant for significant differences in electrical parameters. These methods have many advantages over more traditional approaches
Keywords
design of experiments; ion implantation; semiconductor device manufacture; statistical analysis; dose matching; electrical parameters; equipment matching; equipment qualification; experimental design; fractional factorial design; ion implanter; process qualification; product quality; production machine; semiconductor fab; split-lot qualification; statistical analysis; Control charts; Current density; Current measurement; Density measurement; Design for experiments; Implants; Noise reduction; Production; Qualifications; Statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Ion Implantation Technology. Proceedings of the 11th International Conference on
Conference_Location
Austin, TX
Print_ISBN
0-7803-3289-X
Type
conf
DOI
10.1109/IIT.1996.586416
Filename
586416
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