Title :
Energy recovery circuit for testing high average power
Author_Institution :
Phys. Int. Co., San Leandro, CA
Abstract :
In high-average-power, high-repetition modulator systems, component testing requires a suitable testbed to perform validation and lifetime tests. The author describes a circuit for testing high-average-power components. Design information is given to show how to build a testbed that will operate at an overall power gain, defined as the power the switches operate at divided by the input power, of 10 to 20. Circuit losses are analyzed. The advantages and disadvantages of this type of circuit are discussed
Keywords :
life testing; modulators; switches; circuit losses; component testing; energy recovery circuit; high average power; high-repetition modulator systems; lifetime tests; testbed; testing; validation tests; Capacitors; Circuit testing; Cooling; Life testing; Magnetic modulators; Physics; Switches; Switching circuits; System testing; Voltage;
Conference_Titel :
Power Modulator Symposium, 1988. IEEE Conference Record of the 1988 Eighteenth
Conference_Location :
Hilton Head, SC
DOI :
10.1109/MODSYM.1988.26257
