Title :
Demonstration of newly invented negative-mask scanning imaging scheme using THz-radiation sources
Author :
Ono, S. ; Ohtake, H. ; Izumida, S. ; Yano, T. ; Sakai, M. ; Liu, Z. ; Nakayama, Y. ; Tsukamoto, T. ; Sarukura, N.
Author_Institution :
Inst. for Molecular Sci., Okazaki, Japan
fDate :
Aug. 30 1999-Sept. 3 1999
Abstract :
We have demonstrated an imaging experiment in the THz-radiation region using a newly invented negative-mask scanning scheme. This new imaging scheme will be widely applicable for various image-inspection applications using other light or particle sources without irradiating strong flux onto the object.
Keywords :
masks; optical scanners; submillimetre wave imaging; THz-radiation sources; image-inspection applications; imaging experiment; imaging scheme; negative-mask scanning imaging scheme; negative-mask scanning scheme; particle sources; strong flux; Facsimile; High-resolution imaging; Light sources; Optical imaging; Pixel; Radiation detectors; Signal detection; Spatial resolution; Telephony; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO/Pacific Rim '99. The Pacific Rim Conference on
Conference_Location :
Seoul, South Korea
Print_ISBN :
0-7803-5661-6
DOI :
10.1109/CLEOPR.1999.811510
