Title :
2007 Symposium on VLSI Technology
Abstract :
A collection of slides from the authors conference presentation is given.
Keywords :
CMOS image sensors; SRAM chips; VLSI; integrated circuit reliability; mixed analogue-digital integrated circuits; CMOS image sensor; RF integrated circuit; SRAM; VLSI; gate dielectric reliability; metal gate stacks; mixed signal integrated circuit; mobility enhancement; multi gate FET; pore phase change memory; solid electrode switch; strained silicon technology;
Conference_Titel :
VLSI Technology, 2007 IEEE Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-4-900784-03-1
DOI :
10.1109/VLSIT.2007.4339670
