Fourier transform analysis of Franz-Keldysh oscillations in electromodulation spectroscopy

Author

Glembocki, O.J. ; Tuchman, J.A. ; Holm, R.T. ; Peckerar, M.C.

Author_Institution

Naval Res. Lab., Washington, DC, USA

Volume

2

fYear

1994

fDate

31 Oct-3 Nov 1994

Firstpage

214

Abstract

Fourier transform (FT) analysis is applied to electromodulation data for circumstances in which Franz-Keldysh oscillations (FKO) dominate the optical spectrum. It is shown that the FT analysis simplifies the procedure for obtaining the electric fields from the FKO´s. In addition, an internal check is provided by virtue of the fact that both light and heavy hole contributions to the optical spectrum are resolved in the transformed data. Applications to various device structures are considered from simple structures optimized for the FKO effect to HEMTs and HBTs

Keywords

electro-optical modulation; FT analysis; Fourier transform analysis; Franz-Keldysh oscillations; HEMT; device structures; electric fields; electromodulation spectroscopy; heavy hole contributions; internal check; light hole contributions; optical spectrum; Electric variables measurement; Fourier transforms; Gallium arsenide; HEMTs; Laboratories; Performance evaluation; Photonic band gap; Probes; Silicon compounds; Spectroscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE

Conference_Location

Boston, MA

Print_ISBN

0-7803-1470-0

Type

conf

DOI

10.1109/LEOS.1994.586446

Filename

586446