Title :
Structural similarity metrics for texture analysis and retrieval
Author :
Zujovic, Jana ; Pappas, Thrasyvoulos N. ; Neuhoff, David L.
Author_Institution :
EECS Dept., Northwestern Univ., Evanston, IL, USA
Abstract :
The development of objective texture similarity metrics for image analysis applications differs from that of traditional image quality metrics because substantial point-by-point deviations are possible for textures that according to human judgment are essentially identical. Thus, structural similarity metrics (SSIM) attempt to incorporate ¿structural¿ information in image comparisons. The recently proposed structural texture similarity metric (STSIM) relies entirely on local image statistics. We extend this idea further by including a broader set of local image statistics, basing the selection on metric performance as compared to subjective evaluations. We utilize both intra- and inter-subband correlations, and also incorporate information about the color composition of the textures into the similarity metrics. The performance of the proposed metrics is compared to PSNR, SSIM, and STSIM on the basis of subjective evaluations using a carefully selected set of 50 texture pairs.
Keywords :
image colour analysis; image retrieval; image texture; statistical analysis; color composition; image analysis applications; local image statistics; structural texture similarity metric; texture analysis; texture retrieval; Humans; Image analysis; Image coding; Image color analysis; Image quality; Image retrieval; Image texture analysis; PSNR; Statistics; Wavelet domain; Steerable filter decomposition; dominant colors; image compression; image retrieval;
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2009.5413897