Title :
The Safest Key-Smart Key
Author :
Raghav, A. ; Shashanka, D. ; Chandra, P. S. Sumukha ; Tejas, D.C. ; Panda, Subodh Kumar
Author_Institution :
BNM Inst. Of Technol., Bangalore, India
Abstract :
Crime inhibits the development of a society. Preventive measures taken at the right time can prevent theft and burglary from victimizing civilians. This paper presents a simple, embedded, low cost solution to domestic security that is intuitive, economic and implementable. The proposed model incorporates two layers of security. One is biometric finger print recognition and the other is a password consisting of a preset number of pulsed vibrations that can only be felt. The key to strong security is established by random delays between successive vibrations. Successive authentications lack pattern, as they happen in random time, leaving observers clueless. We call this the Smart Key. The Smart Key does not require significant maintenance and is powered by its own embedded DC UPS. In this way, it removes any requirements such as an external UPS/Inverter which can be expensive. The data less design of Smart Keys make them universal and identical, which frees the user from any distress in case it is lost. The system design is very modular and welcomes expansion of functionality with ease. It has a regulated variable DC power supply port for additional peripherals, making it a stand-alone reliable security system.
Keywords :
delays; domestic safety; fingerprint identification; national security; reliability; uninterruptible power supplies; vibrations; biometric finger print recognition; burglary prevention; domestic security; embedded DC UPS; external UPS-Inverter; home security system; maintenance; peripheral; pulsed vibration; random delay; regulated variable DC power supply port; smart key; stand-alone reliable security system; theft prevention; Batteries; Fingerprint recognition; Power supplies; Regulators; Security; Sensors; Uninterruptible power systems;
Conference_Titel :
India Educators' Conference (TIIEC), 2013 Texas Instruments
Conference_Location :
Bangalore
DOI :
10.1109/TIIEC.2013.39