DocumentCode :
3484486
Title :
Feasibility Study of Fault Tolerant Blac Motor Using PM Enhanced Sensing
Author :
Dwivedi, Ankita ; Singh, S.K. ; Srivastava, R.K.
fYear :
2013
fDate :
4-6 April 2013
Firstpage :
216
Lastpage :
221
Abstract :
BLAC motor operation requires the application of identical zero crossing higher voltage applied to its winding. This voltage should be greater than the motional induced EMF. It is possible to obtain a replica of motional induced EMF in its winding using Permanent Magnet (PM) enhanced sensing scheme. Any PM rotor having even number of N-S poles may be suitable for such a scheme. In this paper, the feasibility study of a fault-tolerant BLAC motor using PM enhanced has been experimentally investigated. In actual practice input voltage of PM motor contains larger number of harmonics due to switching action thereby making it quite cumbersome to estimate the EMF induced in its coil. In PM enhanced sensing, the replica of induced EMF is available for each coil under dynamic condition. The scheme introduced can be suitably implemented for fault tolerant motor where the motional induced EMF of each of the winding segment of auxiliary winding may be amplified using commercially available Power Operational amplifier (P-OPAMP). The amplified voltage is used to activate the respective winding segment on the main winding.
Keywords :
brushless machines; electric potential; fault tolerance; operational amplifiers; permanent magnet motors; power amplifiers; rotors; N-S poles; P-OPAMP; PM enhanced sensing scheme; PM rotor; auxiliary winding; brushless AC motor; fault tolerant BLAC motor; identical zero application; motional EMF induction estimation; permanent magnet enhanced sensing scheme; power operational amplifier; switching action; Brushless motors; Circuit faults; Coils; Fault tolerance; Fault tolerant systems; Permanent magnet motors; Windings; Brushless AC (BLAC) motor; Fault tolerant motor; PM enhanced sensing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
India Educators' Conference (TIIEC), 2013 Texas Instruments
Conference_Location :
Bangalore
Type :
conf
DOI :
10.1109/TIIEC.2013.45
Filename :
6757143
Link To Document :
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