Development of Accelerated Life Test

Author

Sijun, Zhao ; Shaoping, Wang ; Jian, Shi ; Lan, Li

Author_Institution

Sch. of Autom. Sci. & Electr. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing

fYear

2008

fDate

21-24 Sept. 2008

Firstpage

1071

Lastpage

1074

Abstract

This paper summarizes the development of accelerated life test types, model, statistical method and its progress. To the mechatronic component whose failure mechanism is related to various operational stresses, the best way is to exploit variable stress accelerated life test (ALT), obtain the likelihood function with failure accumulative method, and then calculate the normal life on the basis of the parameter evaluation. Directing to the parameter evaluation difficulties of multiple parameters, the optimization method is widely used based on genetic algorithm.

Keywords

failure analysis; genetic algorithms; life testing; mechatronics; statistical analysis; accelerated life test; failure accumulative method; failure mechanism; genetic algorithm; likelihood function; mechatronic component; optimization method; statistical method; Automatic testing; Consumer electronics; Costs; Electronic equipment testing; Life estimation; Life testing; Optimization methods; Statistical analysis; Statistics; Stress; accelerated life test; accelerated model; accelerated stresses; statistical method;

fLanguage

English

Publisher

ieee

Conference_Titel

Robotics, Automation and Mechatronics, 2008 IEEE Conference on

Conference_Location

Chengdu

Print_ISBN

978-1-4244-1675-2

Electronic_ISBN

978-1-4244-1676-9

Type

conf

DOI

10.1109/RAMECH.2008.4681467

Filename

4681467