• DocumentCode
    3485433
  • Title

    A Level of Detail Selection Method for Multi-Type Objects Based on The Span of Level Changed

  • Author

    Yu, Zhuo ; Liang, Xiaohui ; Chen, Zhiyu

  • Author_Institution
    State Key Lab. of Virtual Reality Technol. & Syst., Beihang Univ., Beijing
  • fYear
    2008
  • fDate
    21-24 Sept. 2008
  • Firstpage
    1102
  • Lastpage
    1107
  • Abstract
    Level of detail (LOD) selection method is a key component in complex scene rendering and is widely used in time-critical systems. Many studies focus their efforts on developing the LOD selection method to deal with the problem which the scene contains small objects or objects with a single type. This paper gives a LOD selection method handling the situation that the scene contains multi-type objects while the data amount of these objects change dramatically. The preprocessing step of our work is using the extreme simplification way to simplify the objects with large number of primitives and using the quadric error metrics to simplify the small ones. Then we calculate the span of level changed to each type of object separately. In runtime, we organize all the objects into a max heap by using the importance factor for rendering. We get the top element of the heap and change its level until the total data of objects satisfy the condition of time-critical method. Compared to existing solutions, our method is more suitable to the situation when the scene contains different type of objects.
  • Keywords
    rendering (computer graphics); complex scene rendering; level of detail selection method; multitype objects; quadratic error metrics; quadric error metrics; time-critical systems; Application software; Computer applications; Computer science; Data acquisition; Layout; Military computing; Runtime; Time factors; Virtual environment; Virtual reality; LOD selection; multi-type objects; span of level changed; time-critical;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics, Automation and Mechatronics, 2008 IEEE Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-1675-2
  • Electronic_ISBN
    978-1-4244-1676-9
  • Type

    conf

  • DOI
    10.1109/RAMECH.2008.4681503
  • Filename
    4681503