DocumentCode
3485453
Title
Market Forces Driving Acceptance Of ANSI/IEEE Std 1149.1-1990 Boundary-Scan
Author
Tulloss, Rodham E.
Author_Institution
AT&T Bell Laboratories
fYear
1991
fDate
16-18 April 1991
Firstpage
528
Lastpage
533
Abstract
ANSI/IEEE Std 1149.1-1990 [1,7] is advancing rapidly in acceptance. A recent survey of ATE manufacturers indicates they expect a significant impact. ASIC vendors show by their actions that it is not good business to be caught without Boundary-Scan-supporting cells in one´s standard cell library. CAE/CAD tools are beginning to appear with specific features that support Boundary-Scan. Catalog parts are, beginning to appear with Boundary-Scan in them. A number of firms are publicly committed to using Boundary-Scan in their Systems. Department of Defense procurements are giving greater and greater emphasis to testability and diagnosability which will inevitably lead to implementation of test standards including ANSI/IEEE Std 1149.1-1990. In this paper we review the evidence for movement to acceptance of the Standard and some forces that appear to be driving this movement. Familiarity with the Standard is presupposed.
Keywords
Aerospace electronics; Application specific integrated circuits; Automatic testing; Built-in self-test; Circuit testing; Costs; Instruments; Manufacturing; Procurement; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Electro International, 1991
Conference_Location
New York, NY, USA
Type
conf
DOI
10.1109/ELECTR.1991.718269
Filename
718269
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