• DocumentCode
    3485453
  • Title

    Market Forces Driving Acceptance Of ANSI/IEEE Std 1149.1-1990 Boundary-Scan

  • Author

    Tulloss, Rodham E.

  • Author_Institution
    AT&T Bell Laboratories
  • fYear
    1991
  • fDate
    16-18 April 1991
  • Firstpage
    528
  • Lastpage
    533
  • Abstract
    ANSI/IEEE Std 1149.1-1990 [1,7] is advancing rapidly in acceptance. A recent survey of ATE manufacturers indicates they expect a significant impact. ASIC vendors show by their actions that it is not good business to be caught without Boundary-Scan-supporting cells in one´s standard cell library. CAE/CAD tools are beginning to appear with specific features that support Boundary-Scan. Catalog parts are, beginning to appear with Boundary-Scan in them. A number of firms are publicly committed to using Boundary-Scan in their Systems. Department of Defense procurements are giving greater and greater emphasis to testability and diagnosability which will inevitably lead to implementation of test standards including ANSI/IEEE Std 1149.1-1990. In this paper we review the evidence for movement to acceptance of the Standard and some forces that appear to be driving this movement. Familiarity with the Standard is presupposed.
  • Keywords
    Aerospace electronics; Application specific integrated circuits; Automatic testing; Built-in self-test; Circuit testing; Costs; Instruments; Manufacturing; Procurement; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro International, 1991
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/ELECTR.1991.718269
  • Filename
    718269