• DocumentCode
    3485547
  • Title

    DFM EDA Technology: A Lithographic Perspective

  • Author

    Mason, Mark E.

  • Author_Institution
    Texas Instrum. Inc., Dallas
  • fYear
    2007
  • fDate
    12-14 June 2007
  • Firstpage
    90
  • Lastpage
    91
  • Abstract
    Design for manufacturability (DFM) is a broadly used term that can be applied to many yield-related activities in the semiconductor industry. However, recent focus in the industry has centered on managing the impact of the increasing complexity of lithography on process and electrical yield. This paper looks at the evolution of DFM tools with a focus on the impact of lithography on design and how electronic design automation (EDA) tools will be used to compensate for the increasing difference between ideal design data and resulting structures on silicon wafers.
  • Keywords
    electronic design automation; lithography; semiconductor technology; Si; electrical yield; electronic design automation; lithography; silicon wafers; Design for manufacture; Electronic design automation and methodology; Electronics industry; Instruments; Lithography; Manufacturing; Semiconductor device manufacture; Silicon; Space technology; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 2007 IEEE Symposium on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-4-900784-03-1
  • Type

    conf

  • DOI
    10.1109/VLSIT.2007.4339739
  • Filename
    4339739