DocumentCode
3485547
Title
DFM EDA Technology: A Lithographic Perspective
Author
Mason, Mark E.
Author_Institution
Texas Instrum. Inc., Dallas
fYear
2007
fDate
12-14 June 2007
Firstpage
90
Lastpage
91
Abstract
Design for manufacturability (DFM) is a broadly used term that can be applied to many yield-related activities in the semiconductor industry. However, recent focus in the industry has centered on managing the impact of the increasing complexity of lithography on process and electrical yield. This paper looks at the evolution of DFM tools with a focus on the impact of lithography on design and how electronic design automation (EDA) tools will be used to compensate for the increasing difference between ideal design data and resulting structures on silicon wafers.
Keywords
electronic design automation; lithography; semiconductor technology; Si; electrical yield; electronic design automation; lithography; silicon wafers; Design for manufacture; Electronic design automation and methodology; Electronics industry; Instruments; Lithography; Manufacturing; Semiconductor device manufacture; Silicon; Space technology; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 2007 IEEE Symposium on
Conference_Location
Kyoto
Print_ISBN
978-4-900784-03-1
Type
conf
DOI
10.1109/VLSIT.2007.4339739
Filename
4339739
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