Title :
Toward Variability-Aware Design
Author :
Onodera, Hidetoshi
Author_Institution :
Kyoto Univ., Kyoto
Abstract :
Measured variabilities from 0.35 mum to 90 nm processes are explained with a growing concern of within-die components. Variability impact on circuit performance is examined. Design techniques" for mitigating the variability are discussed that include the introduction of regularity and "variation-aware reconfiguration of FPGA.
Keywords :
field programmable gate arrays; integrated circuit design; FPGA; IC design; circuit performance; size 0.35 mum to 90 nm; variability-aware design; variation-aware reconfiguration; within-die components; Circuit optimization; Current measurement; Delay; Driver circuits; Field programmable gate arrays; Fluctuations; Informatics; Integrated circuit interconnections; Semiconductor device measurement; Wire;
Conference_Titel :
VLSI Technology, 2007 IEEE Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-4-900784-03-1
DOI :
10.1109/VLSIT.2007.4339740
