• DocumentCode
    3485667
  • Title

    The BIPM compact Josephson voltage standard

  • Author

    Solve, S. ; Chayramy, R.

  • Author_Institution
    Bur. Int. des poids et mesures (BIPM), Sevres, France
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    155
  • Lastpage
    156
  • Abstract
    The BIPM has developed a new Josephson Voltage Standard (JVS) that will replace the present transportable standard in the near future. The old system has been involved in 17 international comparisons at the level of 10 V in the framework of the BIPM direct on-site JVS key comparison since 1994. The heart of the new primary standard will still consist of arrays of SIS junctions. It will be able to use future 10 V programmable arrays with minor modifications. We present here the technical details of the key parts of the compact primary JVS. The preliminary results of a direct comparison against the current BIPM 10 V primary reference have shown an agreement within a total combined relative uncertainty of 1×10-10 (k = 1).
  • Keywords
    measurement standards; programmable logic arrays; voltage measurement; BIPM; JVS; Josephson voltage standard; SIS junctions; programmable arrays; relative uncertainly; voltage 10 V; Aluminum; Electromagnetic waveguides; Filters; MMICs; Magnetic separation; Measurement standards; Radio frequency; Standards development; Voltage; Waveguide components;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2010 Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4244-6795-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2010.5544756
  • Filename
    5544756