Atomic force microscopy studies of fibers

Performance issues of concern in optical fiber applications include mechanical reliability of fibers, glass/polymer interfacial adhesion, and optical properties such as loss associated with transmission or fiber interconnect. Various aspects of the glass/polymer composite are responsible for these properties. The success of delineating these material properties depends upon the ability to characterize the glass and polymer, especially surfaces and interfaces, to which these properties are intimately related. Atomic force microscopy (AFM) is a technique well suited for these purposes, since it allows direct study of dielectric materials without the need of a conductive coating. In addition, AFM provides a powerful local probe to study, on a nanometric scale, mechanical interactions at surfaces. In this paper, applications of AFM to study various aspects of the optical fiber are reviewed, with emphasis on recent development in studies extending beyond fiber surface flaw characterization