• DocumentCode
    3485718
  • Title

    Investigation on Key Techniques of Measurement Device of Position and Attitude Applied in Large-Scale Pushing Bridge Construction Machinery

  • Author

    Zheng, Qi ; Li, Chao ; Li, Yunhua ; Shuai, Mei

  • Author_Institution
    Sch. of Autom. Sci. & Electr. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing
  • fYear
    2008
  • fDate
    21-24 Sept. 2008
  • Firstpage
    697
  • Lastpage
    701
  • Abstract
    The problem about measurement of position and attitude of the existing pushing railway bridge construction engineering machinery needs to be solved. The paper designs two kinds of measurement devices adopting phototransistors array and CCD aimed at the demands of pushing railway bridge construction. Multiple serial port communication technique is used to connect devices with industrial PC. Effectiveness of these two kinds of devices has been validated in practice, and the results review that they can not only meet the needs of construction, but also can be used under sunlight circumstances. The measurement system and devices improve the efficiency of pushing railway bridge construction greatly and provide valuable reference for other large-scale engineering machinery´s measurement of position and attitude.
  • Keywords
    attitude measurement; bridges (structures); charge-coupled devices; construction industry; machinery; photodetectors; phototransistors; position measurement; CCD; attitude measurement; device connection; large-scale pushing bridge construction machinery; multiple serial port communication; phototransistor array; position measurement; pushing railway bridge construction engineering machinery; Bridges; Charge coupled devices; Communication industry; Construction industry; Large-scale systems; Machinery; Phototransistors; Position measurement; Railway engineering; Structural panels; CCD; Position measurement; phototransistors array;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics, Automation and Mechatronics, 2008 IEEE Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-1675-2
  • Electronic_ISBN
    978-1-4244-1676-9
  • Type

    conf

  • DOI
    10.1109/RAMECH.2008.4681518
  • Filename
    4681518