Title :
A new method for measuring accurate equivalent source reflection coefficient of three-port devices
Author_Institution :
Nat. Metrol. Inst. of Japan, Tsukuba, Japan
Abstract :
A simple and rigorous method for measuring the equivalent source reflection coefficient of three-port devices is reported in this paper. It is shown that two-port scattering-parameter measurements of a three-port device, one of the output ports of which was alternately terminated with two different reflecting devices, give an accurate value of the equivalent source reflection coefficient.
Keywords :
S-parameters; calibration; network analysers; power dividers; power meters; equivalent source reflection coefficient measurement; multiport VNA; power splitter; three-port devices; two-port scattering-parameter measurements; Calibration; Costs; Directional couplers; Electromagnetic measurements; Electromagnetic reflection; Electromagnetic scattering; Metrology; Scattering parameters; Tuners; Uncertainty;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5544759
