Title :
Embedded software verification: Challenges and solutions
Author :
Chao Wang ; Ganai, Malay ; Lahiri, Shuvendu ; Kroening, Daniel
Author_Institution :
NEC Labs America, Princeton, NJ, USA
Abstract :
Embedded software are becoming more and more pervasive in our lives, and many application domains have very high reliability requirements. Ensuring high software quality while still maintaining software productivity is a challenging task. In order to address this challenge, more formal analysis and automated verification techniques are needed in addition to standard software testing.
Keywords :
Application software; Arithmetic; Chaos; Embedded software; Lithography; Nanolithography; National electric code; Productivity; Software maintenance; Software quality;
Conference_Titel :
Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
978-1-4244-2819-9
Electronic_ISBN :
1092-3152
DOI :
10.1109/ICCAD.2008.4681536
