• DocumentCode
    3486101
  • Title

    Floating Body DRAM Characteristics of Silicon-On-ONO (SOONO) Devices for System-on-Chip (SoC) Applications

  • Author

    Oh, Chang Woo ; Kim, Na Young ; Song, Ho Ju ; Hong, Sung In ; Kim, Sung Hwan ; Choi, Yong Lack ; Bae, Hyun Jun ; Choi, Dong Uk ; Lee, Yong Seok ; Kim, Dong-Won ; Park, Donggun ; Ryu, Byung-Il

  • Author_Institution
    Samsung Electron. Co., Yongin
  • fYear
    2007
  • fDate
    12-14 June 2007
  • Firstpage
    168
  • Lastpage
    169
  • Abstract
    We completed the demonstration of three key functions of SOONO devices by demonstrating the DRAM characteristics of FD and PD SOONO devices successfully, together with the previously reported logic transistor and flash memory characteristics. Floating body SOONO DRAM cells implemented on electrically thin buried insulator shows the large sensing margins more than 5muA in FD device with long data retention and nondestructive read even at the W/L of 60/55nm which is the smallest IT DRAM ever reported.
  • Keywords
    DRAM chips; Si; electrically thin buried insulator; flash memory characteristics; floating body DRAM characteristics; silicon-On-ONO devices; system-on-chip applications; Costs; Dielectrics and electrical insulation; Impact ionization; Logic devices; Random access memory; Research and development; Scalability; Silicon on insulator technology; System-on-a-chip; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 2007 IEEE Symposium on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-4-900784-03-1
  • Type

    conf

  • DOI
    10.1109/VLSIT.2007.4339769
  • Filename
    4339769