DocumentCode :
3486101
Title :
Floating Body DRAM Characteristics of Silicon-On-ONO (SOONO) Devices for System-on-Chip (SoC) Applications
Author :
Oh, Chang Woo ; Kim, Na Young ; Song, Ho Ju ; Hong, Sung In ; Kim, Sung Hwan ; Choi, Yong Lack ; Bae, Hyun Jun ; Choi, Dong Uk ; Lee, Yong Seok ; Kim, Dong-Won ; Park, Donggun ; Ryu, Byung-Il
Author_Institution :
Samsung Electron. Co., Yongin
fYear :
2007
fDate :
12-14 June 2007
Firstpage :
168
Lastpage :
169
Abstract :
We completed the demonstration of three key functions of SOONO devices by demonstrating the DRAM characteristics of FD and PD SOONO devices successfully, together with the previously reported logic transistor and flash memory characteristics. Floating body SOONO DRAM cells implemented on electrically thin buried insulator shows the large sensing margins more than 5muA in FD device with long data retention and nondestructive read even at the W/L of 60/55nm which is the smallest IT DRAM ever reported.
Keywords :
DRAM chips; Si; electrically thin buried insulator; flash memory characteristics; floating body DRAM characteristics; silicon-On-ONO devices; system-on-chip applications; Costs; Dielectrics and electrical insulation; Impact ionization; Logic devices; Random access memory; Research and development; Scalability; Silicon on insulator technology; System-on-a-chip; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 2007 IEEE Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-4-900784-03-1
Type :
conf
DOI :
10.1109/VLSIT.2007.4339769
Filename :
4339769
Link To Document :
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