DocumentCode
3486575
Title
Adjustment-based modeling for Statistical Static Timing Analysis with high dimension of variability
Author
Xie, Lin ; Davoodi, Azadeh ; Zhang, Jun ; Wu, Tai-Hsuan
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin, Madison, WI
fYear
2008
fDate
10-13 Nov. 2008
Firstpage
181
Lastpage
184
Abstract
This paper presents an adjustment-based modeling framework for statistical static timing analysis (SSTA) when the dimension of parameter variability is high. Instead of building a complex model between the circuit timing and parameter variability, we build a model which adjusts an approximate variation-aware timing into an accurate one. The intuition is that it is simpler to build a model which adjusts an approximate estimate into an accurate one. It is also more efficient to obtain an approximate circuit timing model. The combination of these two observations makes the use of an adjustment-based model a good choice for SSTA with high dimension of parameter variability. To build the adjustment model, we use a simulation-based approach, which is based on Gaussian Process. Combined with intelligent sampling, we show that an adjustment-based model can more effectively capture the nonlinearity of the circuit timing with respect to parameter variability compared to polynomial modeling. We also show that with only 200 samples of the circuit timing and 42 independent parameter variations, adjustment-based modeling obtains higher accuracy than direct SSTA using quadratic modeling.
Keywords
Gaussian processes; polynomials; timing circuits; Gaussian process; adjustment-based modeling; circuit timing; intelligent sampling; parameter variability; quadratic modeling; statistical static timing analysis; variation-aware timing; Circuit simulation; Delay; Flexible printed circuits; Gaussian processes; Integrated circuit interconnections; Monte Carlo methods; Polynomials; Sampling methods; Statistical analysis; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
978-1-4244-2819-9
Electronic_ISBN
1092-3152
Type
conf
DOI
10.1109/ICCAD.2008.4681571
Filename
4681571
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