Title :
A three-dimensional visualization tool for software fault analysis of a distributed system
Author :
Amari, Haruo ; Okada, Mikio
Author_Institution :
Comput. & Commun. R&D Center, Tokyo Electr. Power Co. Inc., Japan
Abstract :
We propose a software visualization tool named Software Visualization Supporting Space (SVSS) utilizing three-dimensional (3D) graphics in order to detect and analyze software faults in a large-scale distributed system. When a failure occurs in a software testing process, it is necessary for fault detection to inspect a large number of software processes from various viewpoints. 3D graphical representations allow a greater quantity of data as well as complex structures and relationships between components to be displayed on the screen effectively. SVSS can analyze the source code regularly to generate structural data of the target software. Moreover, it can also analyze the behavior of the processes using trace data obtained automatically by embedding a trace data acquisition function in the target machine. The results of these analysis functions can be visualized collectively on a common display so that the developer can trace execution flows and static connections simultaneously. The work reduction ratio using SVSS was estimated by sampling faults that had occurred in practical development of a distributed power control system
Keywords :
data acquisition; distributed processing; power control; program debugging; program testing; program visualisation; 3D graphics; Software Visualization Supporting Space; distributed power control system; distributed system; fault detection; sampling faults; software fault analysis; software testing; software visualization tool; source code; three-dimensional visualization tool; trace data acquisition function; Data acquisition; Data visualization; Displays; Fault detection; Graphics; Large-scale systems; Power control; Sampling methods; Software testing; Software tools;
Conference_Titel :
Systems, Man, and Cybernetics, 1999. IEEE SMC '99 Conference Proceedings. 1999 IEEE International Conference on
Conference_Location :
Tokyo
Print_ISBN :
0-7803-5731-0
DOI :
10.1109/ICSMC.1999.812399