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DocumentCode :

3487134

Title :

Automatic Integrated Offset Compensation

Author :

Gille, L. ; Dumont, D. ; Boulder, B.

Author_Institution :

INSA Lyon

fYear :

1991

fDate :

16-18 April 1991

Firstpage :

642

Lastpage :

646

Keywords :

Analog integrated circuits; Application specific integrated circuits; Automatic testing; Bipolar integrated circuits; Circuit testing; Operational amplifiers; Process control; Production; Vehicles; Voltage;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Electro International, 1991

Conference_Location :

New York, NY, USA

Type :

conf

DOI :

10.1109/ELECTR.1991.718290

Filename :

718290

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3487134