• DocumentCode
    3487175
  • Title

    Bragg enhancement in optically encoded volume plasma gratings in In-doped CdZnTe

  • Author

    MacDonald, R.L. ; Linke, R.A. ; Thio, T. ; Chadi, J.D. ; Devlin, G.E. ; Becla, P.

  • Author_Institution
    NEC Res. Inst., Princeton, NJ, USA
  • Volume
    2
  • fYear
    1994
  • fDate
    31 Oct-3 Nov 1994
  • Firstpage
    340
  • Abstract
    Volume diffraction gratings, resulting from the plasma effect, are encoded in a new class of materials. The effect, based on persistent photoconductivity (PPC) associated with DX centers. Exposure of samples to light of sufficient photon energy generates free electrons via ionization of DX centers. Illumination with spatially varying light imprints a spatially varying free carrier density, which generates local refractive index changes via the plasma effect index changes. The extension of this effect to II-VI semiconductors offers the possibility of stability at higher temperatures, availability of high quality bulk crystals, and a wider range of excitation and readout wavelengths. Samples used in initial experiments were In-doped CdZnTe, grown using the Bridgeman technique
  • Keywords
    cadmium compounds; Bragg enhancement; Bridgeman technique; CdZnTe:In; DX centers; II-VI semiconductors; In-doped CdZnTe; encoded; free electrons; high quality bulk crystals; higher temperatures; ionization; local refractive index changes; optically encoded volume plasma gratings; persistent photoconductivity; photon energy; plasma effect; plasma effect index changes; readout wavelengths; spatially varying free carrier density; spatially varying light; stability; volume diffraction gratings; Bragg gratings; Diffraction gratings; Electron optics; Optical diffraction; Optical materials; Optical refraction; Optical variables control; Plasma density; Plasma materials processing; Plasma temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1994. LEOS '94 Conference Proceedings. IEEE
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-1470-0
  • Type

    conf

  • DOI
    10.1109/LEOS.1994.586603
  • Filename
    586603