Title :
A simple approach for designing online testable reversible circuits
Author :
Nayeem, N.M. ; Rice, J.E.
Author_Institution :
Dept. of Math & Comput. Sci., Univ. of Lethbridge, Lethbridge, AB, Canada
Abstract :
This paper presents a simple technique to convert an ESOP-based reversible circuit into an online testable circuit. The technique does not require redesigning the whole circuit for integrating the testability feature, and no new garbage outputs are produced other than the garbage outputs needed for the ESOP-circuit. With a little extra hardware cost, the resultant circuit can detect online any single-bit errors. Experimental results show that the proposed technique can achieve an improvement of up to 58% in quantum cost and 99% in garbage outputs in average, compared to the previous work.
Keywords :
automatic test equipment; design for testability; logic circuits; logic design; ESOP-based reversible circuit; garbage output; hardware cost; online detection; online testable reversible circuit designing; quantum cost; resultant circuit; single bit error; testability feature; Circuit faults; Heating; Input variables; Logic gates; Logic testing; Quantum computing; Rails;
Conference_Titel :
Communications, Computers and Signal Processing (PacRim), 2011 IEEE Pacific Rim Conference on
Conference_Location :
Victoria, BC
Print_ISBN :
978-1-4577-0252-5
Electronic_ISBN :
1555-5798
DOI :
10.1109/PACRIM.2011.6032872