Title :
Some methods for profile measurement and an application for on-machine measurement
Author :
Ai, Xiaoyong ; Shimizu, Tsuyoshi ; Obi, Makoto
Author_Institution :
Graduate Sch. of Eng., Yamanashi Univ., Kofu, Japan
Abstract :
In previously published papers, many methods for profile measurement have been discussed deeply. From the point of view of practicability and accuracy improvement, four kinds of profile measurement methods (conventional reversal method, improved reversal method, displacement method, improved displacement method) are discussed through theoretical analyses and the profile measurement experiments in this paper, and the improved displacement method has been applied to on-machine measurement
Keywords :
digital instrumentation; measurement systems; displacement method; on-machine measurement; profile measurement; profile measurement experiments; reversal method; Artificial intelligence; Displacement measurement; Distortion measurement; Electronic mail; Instruments; Machine tools; Mechanical systems; Mechanical variables measurement; Position measurement; Systems engineering and theory;
Conference_Titel :
Systems, Man, and Cybernetics, 1999. IEEE SMC '99 Conference Proceedings. 1999 IEEE International Conference on
Conference_Location :
Tokyo
Print_ISBN :
0-7803-5731-0
DOI :
10.1109/ICSMC.1999.812451
