DocumentCode
348731
Title
Some methods for profile measurement and an application for on-machine measurement
Author
Ai, Xiaoyong ; Shimizu, Tsuyoshi ; Obi, Makoto
Author_Institution
Graduate Sch. of Eng., Yamanashi Univ., Kofu, Japan
Volume
4
fYear
1999
fDate
1999
Firstpage
481
Abstract
In previously published papers, many methods for profile measurement have been discussed deeply. From the point of view of practicability and accuracy improvement, four kinds of profile measurement methods (conventional reversal method, improved reversal method, displacement method, improved displacement method) are discussed through theoretical analyses and the profile measurement experiments in this paper, and the improved displacement method has been applied to on-machine measurement
Keywords
digital instrumentation; measurement systems; displacement method; on-machine measurement; profile measurement; profile measurement experiments; reversal method; Artificial intelligence; Displacement measurement; Distortion measurement; Electronic mail; Instruments; Machine tools; Mechanical systems; Mechanical variables measurement; Position measurement; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man, and Cybernetics, 1999. IEEE SMC '99 Conference Proceedings. 1999 IEEE International Conference on
Conference_Location
Tokyo
ISSN
1062-922X
Print_ISBN
0-7803-5731-0
Type
conf
DOI
10.1109/ICSMC.1999.812451
Filename
812451
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