DocumentCode
3488344
Title
From hemorrhage to midline shift: A new method of tracing the deformed midline in traumatic brain injury ct images
Author
Liu, Ruizhe ; Li, Shimiao ; Tan, Chew Lim ; Pang, Boon Chuan ; Lim, C. C Tchoyoson ; Lee, Cheng Kiang ; Tian, Qi ; Zhang, Zhuo
Author_Institution
Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
fYear
2009
fDate
7-10 Nov. 2009
Firstpage
2637
Lastpage
2640
Abstract
In intracranial pathological examinations using CT scan, brain midline shift (MLS) is an important diagnostic feature indicating the pathological severity and patient´s survival possibility. In this paper, we develop a new method of tracing the brain midline shift in traumatic brain injury (TBI) CT images using its original cause - the hemorrhage. Firstly, we model the relationship between the hemorrhage and the midline deformation caused by it using a linear regression model (H-MLS model). Secondly, using the H-MLS model, the deformed midline is predicted from the hemorrhage detected in CT images. Finally, the predicted deformed midline is adjusted according to the visual symmetry information. Preliminary experiments show that the proposed method is effective and time-efficient.
Keywords
biomechanics; brain; computerised tomography; injuries; medical image processing; neurophysiology; regression analysis; CT images; brain midline shift; diagnostic feature; hemorrhage; intracranial pathological examinations; linear regression model; midline deformation; pathological severity; patient survival possibility; traumatic brain injury; visual symmetry information; Brain injuries; Computed tomography; Deformable models; Hemorrhaging; Linear regression; Multilevel systems; Nervous system; Pathology; Predictive models; Tumors; Medical image analysis; computed tomography; hemorrhage; midline shift; traumatic brain injury;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location
Cairo
ISSN
1522-4880
Print_ISBN
978-1-4244-5653-6
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2009.5414092
Filename
5414092
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