DocumentCode :
3488344
Title :
From hemorrhage to midline shift: A new method of tracing the deformed midline in traumatic brain injury ct images
Author :
Liu, Ruizhe ; Li, Shimiao ; Tan, Chew Lim ; Pang, Boon Chuan ; Lim, C. C Tchoyoson ; Lee, Cheng Kiang ; Tian, Qi ; Zhang, Zhuo
Author_Institution :
Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
fYear :
2009
fDate :
7-10 Nov. 2009
Firstpage :
2637
Lastpage :
2640
Abstract :
In intracranial pathological examinations using CT scan, brain midline shift (MLS) is an important diagnostic feature indicating the pathological severity and patient´s survival possibility. In this paper, we develop a new method of tracing the brain midline shift in traumatic brain injury (TBI) CT images using its original cause - the hemorrhage. Firstly, we model the relationship between the hemorrhage and the midline deformation caused by it using a linear regression model (H-MLS model). Secondly, using the H-MLS model, the deformed midline is predicted from the hemorrhage detected in CT images. Finally, the predicted deformed midline is adjusted according to the visual symmetry information. Preliminary experiments show that the proposed method is effective and time-efficient.
Keywords :
biomechanics; brain; computerised tomography; injuries; medical image processing; neurophysiology; regression analysis; CT images; brain midline shift; diagnostic feature; hemorrhage; intracranial pathological examinations; linear regression model; midline deformation; pathological severity; patient survival possibility; traumatic brain injury; visual symmetry information; Brain injuries; Computed tomography; Deformable models; Hemorrhaging; Linear regression; Multilevel systems; Nervous system; Pathology; Predictive models; Tumors; Medical image analysis; computed tomography; hemorrhage; midline shift; traumatic brain injury;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
ISSN :
1522-4880
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2009.5414092
Filename :
5414092
Link To Document :
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