• DocumentCode
    3488456
  • Title

    Temperature characteristics of electret condenser microphones

  • Author

    Yasuno, Yoshinobu ; Ohga, Juro

  • Author_Institution
    Panasonic SC Device Solutions Co. Ltd., Yokohama, Japan
  • fYear
    2005
  • fDate
    11-14 Sept. 2005
  • Firstpage
    412
  • Lastpage
    415
  • Abstract
    A microphone should be robust when it is used for the mobile equipments. Generally in diaphragm electret type, as the temperature characteristic of diaphragm stiffness and gain characteristic of FET is opposite. These properties make the temperature characteristics of the sensitivity compensated to be almost flat. On the other hand, as fixed electrode electret type using PET diaphragm which has the same temperature coefficient as FET, consequently it is difficult to compensate the temperature characteristics. It is insufficient to say that still it is robust to temperature. In order to improve the temperature characteristic, an evaluation method about the temperature dependence of acoustic characteristics of electret condenser microphone is proposed. This report refers to the temperature dependence of the dominant parameter which the sensitivity of the microphone is being determined, and reported about the design method of the microphone that a temperature characteristic is stable. Finally, the silicone of the inorganic material is applied to the diaphragm and source follower circuit is effective about the high temperature 80 degrees C in impedance converter The possibility of electret condenser microphone which has a flat temperature characteristic was proposed.
  • Keywords
    acoustoelectric devices; electrets; field effect transistors; microphones; FET; acoustic characteristics; diaphragm electret type; diaphragm stiffness; electret condenser microphones; electrode electret type; gain characteristic; microphone sensitivity; mobile equipments; silicone; temperature characteristics; Design methodology; Electrets; Electrodes; FETs; Inorganic materials; Microphones; Positron emission tomography; Robustness; Temperature dependence; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 2005. ISE-12. 2005 12th International Symposium on
  • Print_ISBN
    0-7803-9116-0
  • Type

    conf

  • DOI
    10.1109/ISE.2005.1612411
  • Filename
    1612411