• DocumentCode
    3488671
  • Title

    A numerical optimization-based methodology for application robustification: Transforming applications for error tolerance

  • Author

    Sloan, Joseph ; Kesler, David ; Kumar, Rakesh ; Rahimi, Ali

  • Author_Institution
    Univ. of Illinois, Urbana, IL, USA
  • fYear
    2010
  • fDate
    June 28 2010-July 1 2010
  • Firstpage
    161
  • Lastpage
    170
  • Abstract
    There have been several attempts at correcting process variation induced errors by identifying and masking these errors at the circuit and architecture level. These approaches take up valuable die area and power on the chip. As an alternative, we explore the feasibility of an approach that allows these errors to occur freely, and handle them in software, at the algorithmic level. In this paper, we present a general approach to converting applications into an error tolerant form by recasting these applications as numerical optimization problems, which can then be solved reliably via stochastic optimization. We evaluate the potential robustness and energy benefits of the proposed approach using an FPGA-based framework that emulates timing errors in the floating point unit (FPU) of a Leon3 processor. We show that stochastic versions of applications have the potential to produce good quality outputs in the face of timing errors under certain assumptions. We also show that good quality results are possible for both intrinsically robust algorithms as well as fragile applications under these assumptions.
  • Keywords
    field programmable gate arrays; gradient methods; learning (artificial intelligence); microprocessor chips; software architecture; stochastic programming; FPGA-based framework; Leon3 processor; application robustification; architecture level; chip die area; chip power; circuit level; error tolerance; field programmable gate array; floating point unit; numerical optimization; process variation induced errors; stochastic optimization; Application software; Circuits; Computer architecture; Error correction; Optimization methods; Potential energy; Robustness; Software algorithms; Stochastic processes; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-7500-1
  • Electronic_ISBN
    978-1-4244-7499-8
  • Type

    conf

  • DOI
    10.1109/DSN.2010.5544923
  • Filename
    5544923