DocumentCode
3488726
Title
AutomaDeD: Automata-based debugging for dissimilar parallel tasks
Author
Bronevetsky, Greg ; Laguna, Ignacio ; Bagchi, Saurabh ; De Supinski, Bronis R. ; Ahn, Dong H. ; Schulz, Martin
Author_Institution
Lawrence Livermore Nat. Lab., Lawrence, CA, USA
fYear
2010
fDate
June 28 2010-July 1 2010
Firstpage
231
Lastpage
240
Abstract
Today´s largest systems have over 100,000 cores, with million-core systems expected over the next few years. This growing scale makes debugging the applications that run on them a daunting challenge. Few debugging tools perform well at this scale and most provide an overload of information about the entire job. Developers need tools that quickly direct them to the root cause of the problem. This paper presents AutomaDeD, a tool that identifies which tasks of a large-scale application first manifest a bug at a specific code region and specific program execution point. AutomaDeD statistically models the application´s control-flow and timing behavior, grouping tasks and identifying deviations from normal execution, which significantly reduces debugging effort. In addition to a case study in which AutomaDeD locates a bug that occurred during development of MVAPICH, we evaluate AutomaDeD on a range of bugs injected into the NAS parallel benchmarks. Our results demonstrate that AutomaDeD detects the time period when a bug first manifested with 90% accuracy for stalls and hangs and 70% accuracy for interference faults. It identifies the subset of processes first affected by the fault with 80% accuracy and 70% accuracy, respectively and the code region where the fault first manifested with 90% and 50% accuracy, respectively.
Keywords
automata theory; parallel programming; program debugging; program diagnostics; AutomaDeD; MVAPICH; NAS parallel benchmarks; automata-based debugging; dissimilar parallel tasks; specific program execution point; Computer bugs; Debugging; Fault detection; Fault diagnosis; Government; Histograms; Interference; Large-scale systems; Protection; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Dependable Systems and Networks (DSN), 2010 IEEE/IFIP International Conference on
Conference_Location
Chicago, IL
Print_ISBN
978-1-4244-7500-1
Electronic_ISBN
978-1-4244-7499-8
Type
conf
DOI
10.1109/DSN.2010.5544927
Filename
5544927
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