DocumentCode
3488873
Title
VCSEL reliability studies at SUN microsystems physical sciences center
Author
McElfresh, D.K. ; Lopez, L.D. ; Melanson, R. ; Vacar, D.
Author_Institution
Phys. Sci. Center, Sun MicroSysterms Inc., USA
fYear
2004
fDate
28-30 June 2004
Abstract
In this paper, we describe the experiment and review our results to date. Degraded VCSEL arrays have been censored and are currently being subjected to a detailed physical characterization. This analysis will provide a glimpse into the manifestation of VCSEL failures, the mechanisms and physics of emission degradation. Optical interconnects will be required for the bandwidth needs for computing systems in the near future. We have investigated the specific parameters that produce the most reliable VCSELs - the emitter engines for optical interconnects.
Keywords
optical interconnections; reviews; semiconductor laser arrays; surface emitting lasers; computing systems; degraded VCSEL arrays; emission degradation; emitter engines; optical interconnects; physical characterization; Bandwidth; Degradation; Failure analysis; Humidity; Optical computing; Optical interconnections; Stress; Sun; Testing; Vertical cavity surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004 Digest of the LEOS Summer Topical Meetings
ISSN
1099-4742
Print_ISBN
0-7803-8306-0
Type
conf
DOI
10.1109/LEOSST.2004.1338703
Filename
1338703
Link To Document