Title :
Influence of the thickness and thermal treatment on absorbance, emission and surface morphology properties of self-assembly PPV films
Author :
Piovesan, E. ; Marletta, A. ; Vega, M.L. ; Hidalgo, A.A. ; Faria, R.M.
Author_Institution :
Fac. de Fisica, Univ. Fed. de Uberlandia, Brazil
Abstract :
In this report we studied the effect of the thickness and thermal conversion of poly(p-phenylene vinylene) (PPV) films on the optical properties. Self-assembly PPV films were processed with 5 and 75 layers from PPV precursor polymer and dodecylbenzenesulfonate. The thermal conversion treatment was performed at 110 °C and 230 °C. The emission spectra show a red shift when the film thickness increases; demonstrating the influence of substrate/film interface. Strong anisotropy is observed with 5 layer films (0.57), this value decrease to 0.36 with 75 layers and converted at 230 °C. The film surface topology was available using Atomic Force Microscopy aimed at identifying morphology changes in SA-PPV films.
Keywords :
atomic force microscopy; organic semiconductors; photoluminescence; polymer films; red shift; self-assembly; semiconductor thin films; surface morphology; 110 C; 230 C; absorbance; anisotropy; atomic force microscopy; dodecylbenzenesulfonate; emission spectra; film thickness; optical properties; red shift; self-assembly poly(p-phenylene vinylene) film; surface morphology; surface topology; thermal conversion treatment; Anisotropic magnetoresistance; Atomic force microscopy; Optical films; Optical polymers; Polymer films; Self-assembly; Stimulated emission; Substrates; Surface morphology; Surface treatment;
Conference_Titel :
Electrets, 2005. ISE-12. 2005 12th International Symposium on
Print_ISBN :
0-7803-9116-0
DOI :
10.1109/ISE.2005.1612442