• DocumentCode
    348917
  • Title

    EMC development process for information technology equipment

  • Author

    Mandrusov, Val ; Jackman, Tom ; Roaque, Tony ; Friesen, Duane

  • Author_Institution
    Silicon Graphics Comput. Syst., Mountain View, CA, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    121
  • Abstract
    Data processing products continue to be designed using higher and higher clock speeds. This increases EMC related problems, especially in such areas as radiated emissions. At the same time, “market windows” that limit the useful life of a product forces development cycles to become shorter and shorter. If a company is to produce cost effective products in such an environment, EMC must become an integral part of new and sustaining product development cycles. This paper describes how EMC processes and tools, ranging from conceptual design reviews to automated testing, can be effectively integrated into a company´s overall product design strategy
  • Keywords
    automatic testing; electromagnetic compatibility; electromagnetic interference; information technology; product development; telecommunication equipment testing; EMC development process; EMC standards; EMC tools; automated testing; clock speeds; cost effective products; data processing products; documentation; hardware design; information technology equipment; product design; product development cycles; qualification tests; radiated emissions; Circuit testing; Computer graphics; Data processing; Electromagnetic compatibility; Hardware; Information technology; Manufacturing; Product development; Qualifications; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1999 IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-5057-X
  • Type

    conf

  • DOI
    10.1109/ISEMC.1999.812880
  • Filename
    812880