DocumentCode :
348917
Title :
EMC development process for information technology equipment
Author :
Mandrusov, Val ; Jackman, Tom ; Roaque, Tony ; Friesen, Duane
Author_Institution :
Silicon Graphics Comput. Syst., Mountain View, CA, USA
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
121
Abstract :
Data processing products continue to be designed using higher and higher clock speeds. This increases EMC related problems, especially in such areas as radiated emissions. At the same time, “market windows” that limit the useful life of a product forces development cycles to become shorter and shorter. If a company is to produce cost effective products in such an environment, EMC must become an integral part of new and sustaining product development cycles. This paper describes how EMC processes and tools, ranging from conceptual design reviews to automated testing, can be effectively integrated into a company´s overall product design strategy
Keywords :
automatic testing; electromagnetic compatibility; electromagnetic interference; information technology; product development; telecommunication equipment testing; EMC development process; EMC standards; EMC tools; automated testing; clock speeds; cost effective products; data processing products; documentation; hardware design; information technology equipment; product design; product development cycles; qualification tests; radiated emissions; Circuit testing; Computer graphics; Data processing; Electromagnetic compatibility; Hardware; Information technology; Manufacturing; Product development; Qualifications; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
Type :
conf
DOI :
10.1109/ISEMC.1999.812880
Filename :
812880
Link To Document :
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