Title :
1988 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena (IEEE Cat. No.88CH2668-2)
Abstract :
The following topics are dealt with: low pressure and vacuum phenomena; the aging of solid dielectrics; thin-film dielectrics in semiconductors; phenomena in gases, liquids, and solids, prebreakdown phenomena; and charge transport and storage. Abstracts of individual papers can be found under the relevant classification codes in this or other issues
Keywords :
ageing; cable insulation; dielectric properties of substances; dielectric thin films; electric breakdown; insulating materials; insulation testing; space charge; aging; charge transport; gases; insulation testing; liquids; low pressure phenomena; prebreakdown; semiconductors; solid dielectrics; thin-film dielectrics; vacuum phenomena;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1988. Annual Report., Conference on
Conference_Location :
Ottawa, Ontario, Canada
DOI :
10.1109/CEIDP.1988.26303
